美國ELECTROMATIC TI-MVX超聲波測厚儀- 詳細介紹：
美國ELECTROMATIC TI-MVX超聲波測厚儀
The TI-MVX features the highest resolution graphic LCD on the market and is especially engineered for optimal ease of use. It is supplied as a complete kit with all accessories in carrying case with FREE software, transfer cable and NIST-Traceable Calibration Certificate.
Features
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The MVX is equipped with multiple viewing options to provide users with a complete set of inspection tools: (RF waveform, +/- Rectified waveform, Time based B-Scan, and Large Digits).
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The A-Scan rectified mode is commonly used for detecting flaws/pits in pulse-echo mode and measuring through paint and coatings in echo-echo mode.
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The time-based B-Scan feature of the MVX displays a cross section of the test material. It is commonly used to display the profile of the bottom surface of the test material.
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Built in hardware AGC gain control for through paint measurements in multi mode operation.
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The MVX has the ability to store 64 custom user defined setups. All factory setups can be selected, edited and saved to any setup location.
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CE Certified
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Use the visual alarm to set hi and lo limits for applications requiring specific tolerances. If the actual thickness value is above or below the limits, a red light is illuminated.
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Use the find feature to locate the detection point, while automatically adjusting the display to bring the signal into view.
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MVX also comes complete with our Windows® PC software for transferring data to and from a PC.
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Includes Flaw Inspection - Prove Up Mode, (special probe required)
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The high speed scan feature speeds up the inspection process by making 32 measurements per second. Remove transducer from the tesst material, and display the minimum measurement scanned.
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Includes NIST-Traceable Calibration Certificate
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